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Artifacts in high-frequency surface wave dispersion imaging
  • Feng Cheng,
  • Jianghai Xia
Feng Cheng
Rice university, Rice university, Rice university

Corresponding Author:[email protected]

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Jianghai Xia
Zhejiang University, Zhejiang University, Zhejiang University
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Surface wave methods are non-invasive, low-cost, and robust approaches to image near-surface S-wave velocity (Vs) structure. In terms of the energy source types, they can be classified in two groups: active-source surface wave methods and passive-source surface wave methods. A clean and high-resolution dispersion image is critical for the subsequent dispersion curve picking as well as Vs inversion for either the active-source surface wave methods or the passive-source surface wave methods. However, aliasing or other artifacts are almost inevitable in surface wave dispersion measurements in practice, and they can seriously pollute the measured dispersion spectra. It is significant to figure out how they are generated, how they affect the dispersion measurement, and how they can be attenuated. We provide the first comprehensive review on artifacts that are frequently observed in surface wave dispersion measurements, and summary them into three general types, including artifacts from spare spatial sampling, artifacts from array response, and artifacts from weak coherent signals. Both numerical and field examples, as well as mathematic derivations, are presented to help reader understand the generations of the various types artifacts and the way to attenuate them. This work will help us understand the complex components on the measured surface wave dispersion spectra, and lead to potential improvements on dispersion measurements.