Since 1970, increased plastic use and waste mismanagement have contributed to environmental pollution leading to the proliferation of microplastics and ocean contamination. Understanding the plastic presence on-land is crucial as most plastic pollution originates from land-based sources. From its vantage point-of-view on the International Space Station, NASA’s Earth Surface Mineral Dust Source Investigation (EMIT) imaging spectrometer can measure surface reflectance spectra across a wavelength range of 380 nm to 2500 nm. We present a study using this instrument to detect distinctive absorption features of High-density polyethylene (HDPE) and Polyvinyl Chloride (PVC) plastics in the shortwave infrared. By applying a column-wise adaptive matched filter and using a library of plastic reflectance spectra, we successfully identified signatures of these two types of plastics across multiple continents between +/- 52 degrees, primarily related to agricultural practices. Our study underscores the importance of monitoring land-based sources of plastic pollution to guide future mitigation strategies.