High-resolution Multi-reflection Time-of-Flight Mass Spectrometer with Atmospheric Pressure Interface
Shuxiong Yan1,2, Yi Ren1,3*, Qi Huang1,4, Yi Hong3, Zhengge Chen1,4, Mei Li1, Zhengxu Huang1,3**
1(Institute of Mass Spectrometry and Atmospheric Environment, Jinan University, Guangzhou, 510632, China)
2(Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, China)
3(Guangzhou Hexin Instrument Co., Ltd. Guangzhou, 510530, China)
4(Guangdong MS Institute of Scientific Instrument Innovation, Guangzhou, 510000, China)
E-mail addresses:y.ren2@hxmass.com(Y.Ren*), hzx126@126.com(Z.Huang**)