High-resolution Multi-reflection
Time-of-Flight Mass Spectrometer with Atmospheric Pressure Interface
Shuxiong Yan1,2, Yi Ren1,3*, Qi
Huang1,4, Yi Hong3, Zhengge
Chen1,4, Mei Li1, Zhengxu
Huang1,3**
1(Institute of Mass Spectrometry and Atmospheric Environment, Jinan
University, Guangzhou, 510632, China)
2(Shenzhen Institute of Advanced Technology, Chinese Academy of
Sciences, Shenzhen, 518055, China)
3(Guangzhou Hexin Instrument Co., Ltd. Guangzhou, 510530, China)
4(Guangdong MS Institute of Scientific Instrument Innovation, Guangzhou,
510000, China)
E-mail addresses:y.ren2@hxmass.com(Y.Ren*), hzx126@126.com(Z.Huang**)