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4D Electrical Resistivity Imaging of Stress Perturbations Induced During High-Pressure Shear Stimulation Tests
  • +6
  • Tim C Johnson,
  • Jeffrey Burghardt,
  • Christopher Strickland,
  • Dana Sirota,
  • Vince Vermeul,
  • Hunter A Knox,
  • Paul C Schwering,
  • Doug Blankenship,
  • Timothy J Kneafsey
Tim C Johnson
Pacific Northwest National Laboratory (DOE)

Corresponding Author:[email protected]

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Jeffrey Burghardt
Pacific Northwest National Laboratory (DOE)
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Christopher Strickland
Pacific Northwest National Laboratory (DOE)
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Dana Sirota
Pacific Northwest National Laboratory
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Vince Vermeul
Pacific Northwest National Laboratory (DOE)
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Hunter A Knox
Pacific Northwest National Lab
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Paul C Schwering
Sandia National Laboratories
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Doug Blankenship
Sandia National Laboratories
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Timothy J Kneafsey
Lawrence Berkeley Laboratory
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Abstract

Fluid flow through fractured media is typically governed by the distribution of fracture apertures, which are in turn governed by stress. Consequently, understanding subsurface stress is critical for understanding and predicting subsurface fluid flow. Although laboratory-scale studies have established a sensitive relationship between effective stress and bulk electrical conductivity in crystalline rock, that relationship has not been extensively leveraged to monitor stress evolution at the field scale using electrical or electromagnetic geophysical monitoring approaches. In this paper we demonstrate the use time-lapse 3-dimensional (4D) electrical resistivity tomography to image perturbations in the stress field generated by pressurized borehole packers deployed during shear-stimulation attempts in a 1.25 km deep metamorphic crystalline rock formation.
24 Jan 2024Submitted to ESS Open Archive
24 Jan 2024Published in ESS Open Archive