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Automatic modulation recognition via aligned signals and key features
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  • Fugang Liu,
  • Jingyi Pan,
  • Ruolin Zhou,
  • Xiaolin Jiang
Fugang Liu
Heilongjiang University of Science and Technology

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Jingyi Pan
Heilongjiang University of Science and Technology
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Ruolin Zhou
University of Massachusetts Dartmouth
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Xiaolin Jiang
Jinhua Advanced Research Institute
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Abstract

Deep learning-based classification algorithms have been used for automatic modulation recognition (AMR). However, most methods only focus on end-to-end mapping and neglect the classic key features. In this paper, signals are enforced with key classification features to propose a novel deep learning model for AMR by learning the shared latent space of the aligned signals and key features (LLAF); this is done to increase the generalizability of the model and to ensure the physical plausibility of the results. To obtain adequate signal representations, an encoder-decoder architecture is proposed to learn the shared latent space, and the architecture is trained to approximate prior label distributions for precise signal classification. Simulation results verify the high recognition accuracy of the proposed LLAF model under different signal-to-noise ratios (SNRs).
12 Nov 2022Submitted to Electronics Letters
13 Nov 2022Submission Checks Completed
13 Nov 2022Assigned to Editor
14 Nov 2022Reviewer(s) Assigned
19 Nov 2022Review(s) Completed, Editorial Evaluation Pending
19 Nov 2022Editorial Decision: Revise Minor
29 Nov 20221st Revision Received
29 Nov 2022Submission Checks Completed
29 Nov 2022Assigned to Editor
29 Nov 2022Review(s) Completed, Editorial Evaluation Pending
01 Dec 2022Editorial Decision: Accept
Jan 2023Published in Electronics Letters volume 59 issue 1. 10.1049/ell2.12697